The plant height effect over grain yield, yield components, straw yield, and harvest index, was measured in a field trial that included eight wheat genotypes, originated from four crosses and selected for tall and low plant height. They were sown at Quilamapu Research Regional Center of the "Instituto de Investigaciones Agropecuarias (INIA), Chillán, (Iat. 36°31 'S, long. 71 °55' W and 217 m.a.s.I.), during 1995/96 and 1996/97 seasons. A randomized complete block design with 8 treatments (genotypes) and three replications was used. The results showed that dwarf genotypes had significantly less grain yield than taller sibling genotypes. However, grain yield of the semidwarf genotype was higher than its sibling standard height. Straw yield was similar in all sibling genotypes, except in one dwarf genotype, with less production. Harvest indices among sibling wheats did not show significant differences. |